Bonding and XPS chemical shifts in ZrSiO4 versus SiO2 and ZiO2: Charge transfer and electrostatic effects

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 12, 2001, Pages

  Guittet, M J ^a   Crocombette, J P ^a   Gautier Soyer, M ^a  

^a CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84859165196     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.125117     Document Type: Article

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