Achieving maximum hardness in semi-coherent multilayer thin films with unequal layer thickness

Acta Materialia

Volumn 60, Issue 6-7, 2012, Pages 2625-2636

  Carpenter, John S ^a,b   Misra, Amit ^b   Anderson, Peter M ^a  

^a OHIO STATE UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Dislocations; Hardness; Multilayers; Nanocomposites

Indexed keywords

BILAYER PERIOD; CU FILMS; ELASTO-PLASTIC; FULLY-PLASTIC; IN-PLANE LATTICE PARAMETERS; INTERFACE BARRIER; INTERFACIAL DISLOCATIONS; LAYER THICKNESS; MAXIMUM HARDNESS; MULTI-LAYER THIN FILM; PINNING STRENGTH; SLIP PROPAGATION;

DISLOCATIONS (CRYSTALS); EPITAXIAL FILMS; HARDNESS; MULTILAYERS; NANOCOMPOSITE FILMS; NANOCOMPOSITES;

INTERFACES (MATERIALS);

EID: 84859107099     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.01.029     Document Type: Article

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