Electron microscopy characterization of hot-pressed Al substituted Li 7La 3Zr 2O 12

Journal of Materials Science

Volumn 47, Issue 10, 2012, Pages 4428-4431

  Wolfenstine, J ^a   Sakamoto, J ^b   Allen, J L ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

^b Michigan State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CONCENTRATIONS; ELECTRON MICROSCOPY ANALYSIS; EQUI-AXED GRAINS; GRAIN-BOUNDARY MOBILITY; RELATIVE DENSITY; SINTERING AID; TRIPLE JUNCTION;

ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; POINT DEFECTS; SINTERING; ZIRCONIUM;

ALUMINUM;

EID: 84859105055     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-012-6300-y     Document Type: Review

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