Thermoelectric properties of CaMnO 3 films obtained by soft chemistry synthesis

Journal of Materials Research

Volumn 27, Issue 7, 2012, Pages 985-990

  Alfaruq, Dimas S ^a   Otal, Eugenio H ^a   Aguirre, Myriam H ^a   Populoh, Sascha ^a   Weidenkaff, Anke ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Thermoelectricity; Thin film; Transmission electron microscopy

Indexed keywords

ANNEALED LAYERS; ELECTRICAL RESISTIVITY; METAL ACETATE; N-TYPE CONDUCTION; POLYCRYSTALLINE; POWER FACTORS; PRECURSOR LAYER; PRECURSOR SOLUTIONS; PURE PEROVSKITE PHASE; SAPPHIRE SUBSTRATES; SEMICONDUCTING BEHAVIOR; SOFT CHEMISTRY METHOD; SOFT CHEMISTRY SYNTHESIS; TEMPERATURE RANGE; THERMAL-ANNEALING; THERMOELECTRIC PROPERTIES;

ANNEALING; ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; PEROVSKITE; SAPPHIRE; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 84859028534     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2012.63     Document Type: Article

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