Kelvin probe force microscopy

Springer Series in Surface Sciences

Volumn 48, Issue 1, 2012, Pages

  Sadewasser, Sascha ^a   Glatzel, Thilo ^b  

^a INTERNATIONAL IBERIAN NANOTECHNOLOGY LABORATORY   (Portugal)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84858608982     PISSN: 09315195     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-22566-6     Document Type: Article

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