Neutron powder diffraction measurements of the spinel MgGa 2O4:Cr3+ - A comparative study between the high flux diffractometer D2B at the ILL and the high resolution powder diffractometer Aurora at IPEN

Journal of Physics: Conference Series

Volumn 340, Issue , 2012, Pages

  Da Silva, M A F M ^a   Sosman, L P ^a   Yokaichiya, F ^b,c   Mazzocchi, V L ^d   Parente, C B R ^d   Mestnik Filho, J ^d   Henry, P F ^b,e   Bordallo, H N ^b,e,f  

^a STATE UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b HAHN MEITNER INSTITUT   (Germany)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^d INSTITUTO DE PESQUISAS ENERGÉTICAS E NUCLEARES   (Brazil)

^e EUROPEAN SPALLATION SOURCE ERIC   (Sweden)

^f UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; GALLIUM; INFRARED DEVICES; NEUTRON POWDER DIFFRACTION; NEUTRON SCATTERING; OPTICAL PROPERTIES;

CELLULOSE INDUSTRY; COMPARATIVE STUDIES; CRYSTALLINE STRUCTURE; HIGH RESOLUTION POWDER DIFFRACTOMETER; NEAR-INFRARED SPECTRAL REGIONS; SIGNAL TRANSMISSION; SPINEL COMPOUNDS; TUNABLE RADIATION;

DIFFRACTOMETERS;

EID: 84858600467     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/340/1/012041     Document Type: Conference Paper

References (16)

1. Martines M A U, Davolos M R, Jafelicci Jr M, Souza D F, Nunes L A O 2008 J. Lumin. 128 1787
2. Laroche M, Gilles H, Girard S, Passilly N and Aït-Ameur, K 2006 IEEE Photonics Technology Letters 18 764.
3. Shand M L and Lai S T 1984 J. Opt. Soc. Am. B 20 105
4. Stalder, M, Chai, B H T and Bass M 1991 Appl. Phys. Lett. 58 216
5. Kück S 2001 Appl. Phys. B 72 515
6. Weidenborner J E, Stemple N R and Okaya, Y 1966 Acta Cryst. 20 761
7. Hoffman C W W and Brown J J 1968 J. Inorg. Nuclear Chem. 30 63
8. Brown J J 1967 J. Electrochem. Soc. 3 245
9. Sosman L P, Abritta T, Nakamura O and D'Aguiar Neto M F 1995 J. Mat. Sci. Lett.14 19
10. Garapon C, Brenier A and Moncorgé R 1998 Optical Materials 10 177
11. S. Geller S J. 1960 Chem. Phys. 33 676
12. Åhman, J, Svensson, G and Albertsson, J 1996 Acta Cryst. C52, 1336
13. http://www.ill.eu/instruments-support/instruments-groups/instruments/d2b/ characteristics/
14. Parente C B R, Mazzocchi V L, Mestnik-Filho J, Mascarenhas Y P and Berliner R 2010 Nuclear Instruments and Methods in Physics Research A 622, 678
15. Rodriguez-Carvajal J 1990 FULLPROF: A Program for Rietveld Refinement and Pattern Matching Analysis. In: Abstracts of the Satellite Meeting on Powder Diffraction of the XV Congress of the IUCr
16. M A F M da Silva, PhD Thesis, Universidade Estadual do Rio de Janeiro, 2010