The study of the oxidation of thin Ti films by neutron reflectometry

Journal of Physics: Conference Series

Volumn 340, Issue , 2012, Pages

  Matveev, V A ^a   Pleshanov, N K ^a   Bulkin, A P ^a   Syromyatnikov, V G ^a  

^a PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRON REFLECTION; NEUTRON SCATTERING; OXIDATION; OXIDE FILMS; REFLECTION; REFLECTOMETERS; TITANIUM;

NEUTRON REFLECTOMETRY; OXIDE LAYER THICKNESS; SUPERMIRRORS; THICKNESS OF THE OXIDE LAYERS; THIN LAYERS; TI FILM;

TITANIUM OXIDES;

EID: 84858592249     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/340/1/012086     Document Type: Conference Paper

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