An application of slacks-based measure on quantifying leanness

2006 IIE Annual Conference and Exhibition

Volumn , Issue , 2006, Pages

  Wan, Hung Da ^a   Frank Chen, F ^a  

^a State University   (United States)

Author keywords

Data Envelopment Analysis (DEA); Leanness; Slacks Based Measure (SBM)

Indexed keywords

CHARNES-COOPER-RHODES (CCR) MODELS; SLACKS-BASED MEASURE (SBM);

DATA ENVELOPMENT ANALYSIS; DATA STRUCTURES; DECISION MAKING; VIRTUAL REALITY;

PROCESS ENGINEERING;

EID: 84858458252     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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