Simultaneous electrical transport and scanning tunneling spectroscopy of carbon nanotubes

Nano Letters

Volumn 7, Issue 10, 2007, Pages 2938-2941

  LeRoy, Brian J ^a,b   Heller, Iddo ^a   Pahilwani, Vijay K ^a   Dekker, Cees ^a   Lemay, Serge G ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB PEAKS; DRAIN ELECTRODES; ELECTRICAL TRANSPORT; SCANNING TUNNELING SPECTROSCOPY; COULOMB-BLOCKADE REGIME; ELECTRICAL TRANSPORT MEASUREMENTS; SOURCE AND DRAIN ELECTRODES; SPATIAL DEPENDENCE;

CONTACT RESISTANCE; COULOMB BLOCKADE; ELECTRODES; SCANNING TUNNELING MICROSCOPY; SCANNING; SINGLE-WALLED CARBON NANOTUBES (SWCN);

SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTROSCOPY;

CARBON NANOTUBE;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; MATERIALS TESTING; MICROSCOPY, SCANNING TUNNELING; MODELS, CHEMICAL; MODELS, MOLECULAR; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; SEMICONDUCTORS;

EID: 84858452827     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0708112     Document Type: Article

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