Ceramics based on partly stabilized zirconium dioxide: Technology, structure, properties, and behavior under dynamic action

Refractories and Industrial Ceramics

Volumn 52, Issue 5, 2012, Pages 349-354

  Akopov, F A ^a   Lukin, E S ^c   Milyavskii, V V ^a   Savinykh, A S ^b   Borovkova, L B ^a   Borodina, T I ^a   Val'Yano, G E ^a   Ziborov, V S ^a   Popova, N A ^a  

^a JOINT INSTITUTE FOR HIGH TEMPERATURES   (Russian Federation)

^b SEMENOV INSTITUTE OF CHEMICAL PHYSICS   (Russian Federation)

^c MENDELEEV UNIVERSITY OF CHEMICAL TECHNOLOGY OF RUSSIA   (Russian Federation)

Author keywords

atomic force microscope (AFM); coherent scattering region (CSR); impact wave loading; partly stabilized zirconium dioxide (PSZD); scanning electron microscope (SEM); x ray phase analysis (XPA)

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); COHERENT SCATTERING REGION (CSR); PARTLY STABILIZED ZIRCONIUM DIOXIDE (PSZD); SCANNING ELECTRON MICROSCOPE (SEM); X-RAY PHASE ANALYSIS (XPA);

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; MECHANICAL WAVES; SCANNING ELECTRON MICROSCOPY; ZIRCONIUM;

MANUFACTURE;

EID: 84858452034     PISSN: 10834877     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11148-012-9430-5     Document Type: Article

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