Three-dimensional quantitative chemical roughness of buried ZrO 2/In 2O 3 interfaces via energy-filtered electron tomography

Applied Physics Letters

Volumn 100, Issue 10, 2012, Pages

  Zhong, X Y ^a   Kabius, B ^b   Schreiber, D K ^b   Eastman, J A ^c   Fong, D D ^c   Petford Long, A K ^c  

^a TSINGHUA UNIVERSITY   (China)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA CUBE; ELECTRON TOMOGRAPHY; FLAT INTERFACE; MIXED CONDUCTION; OXIDE INTERFACES; ROOT MEAN SQUARE ROUGHNESS; THREEDIMENSIONAL (3-D);

BEHAVIORAL RESEARCH; CHEMICAL ANALYSIS; ELECTRIC IMPEDANCE TOMOGRAPHY; MULTILAYER FILMS; ZIRCONIUM; ZIRCONIUM ALLOYS;

THREE DIMENSIONAL;

EID: 84858377140     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3690861     Document Type: Article

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