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Volumn 606, Issue 9-10, 2012, Pages 865-871

Structural reorientation of PLD grown La 2NiO 4 thin films

Author keywords

La2NiO4; Pulsed laser deposition; Structural reorientation; Thin films; X ray diffraction

Indexed keywords

CRITICAL THICKNESS; LA2NIO4; OUT-OF-PLANE DIRECTION; OUT-OF-PLANE ORIENTATION; STRUCTURAL REORIENTATION; X RAY DIFFRACTOMETERS;

EID: 84858335884     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2012.02.001     Document Type: Article
Times cited : (6)

References (33)
  • 29
    • 84858339342 scopus 로고    scopus 로고
    • Ph.D. Thesis, The University of Connecticut
    • Feizhou He, Ph.D. Thesis, The University of Connecticut, 2005.
    • (2005)
    • He, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.