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Volumn , Issue , 1999, Pages 333-336

Effect of thermal residual stresses on the apparent interfacial toughness of epoxy/aluminum interface

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; ALUMINUM; BENDING TESTS; CRACKS; FRACTURE TOUGHNESS; INTERFACES (MATERIALS); RESIDUAL STRESSES; SILICA; THERMAL EXPANSION;

EID: 84858296800     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.1999.757334     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 1
    • 0031166703 scopus 로고    scopus 로고
    • Thermal stresses in layered electronic assemblies
    • Z.Q. Jiang et al., "Thermal Stresses in Layered Electronic Assemblies." ASME J. of Electronic Packaging, Vol 119(1997), pp.127-132.
    • (1997) ASME J. of Electronic Packaging , vol.119 , pp. 127-132
    • Jiang, Z.Q.1
  • 2
    • 0023984412 scopus 로고
    • An approximate analysis of stresses in multilayered elastic thin films
    • E. Suhir, "An Approximate Analysis of Stresses in Multilayered Elastic Thin Films," ASME J. of Appl. Mechanics, Vol. 110 (1988), pp.143.
    • (1988) ASME J. of Appl. Mechanics , vol.110 , pp. 143
    • Suhir, E.1
  • 3
    • 0029247126 scopus 로고
    • To cut or not to cut: A thermomechanical stress analysis of polyimide thin film on ceramic structures
    • M. Pecht, et al, "To Cut or Not to Cut: A Thermomechanical Stress Analysis of Polyimide Thin Film on Ceramic Structures," IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B, Vol 18, 1(1995), pp.150.
    • (1995) IEEE Transactions on Components, Packaging, and Manufacturing Technology , vol.18 , Issue.1 , pp. 150
    • Pecht, M.1
  • 4
    • 0342755233 scopus 로고    scopus 로고
    • A consititutive model of polyimide films and its instgration with finite element analysis for residual stress prediction in thin film interconnects
    • S.X. Wu, et al, "A Consititutive Model of Polyimide Films and Its Instgration with Finite Element Analysis for Residual Stress Prediction in Thin Film Interconnects," ASME EEP-Vol. 19-2(1997), Advances in Electronic Packaging, pp.1285-1290.
    • (1997) ASME EEP-19-2 Advances in Electronic Packaging , pp. 1285-1290
    • Wu, S.X.1
  • 9
    • 85037118662 scopus 로고
    • Edge-bonded dissimilar orthogonal elastic wedges
    • Dundurs
    • Dundurs, "Edge-bonded dissimilar orthogonal elastic wedges". J. Appl. Mech. 36 (1969), pp 650652.
    • (1969) J. Appl. Mech. , vol.36 , pp. 650652
  • 12
    • 0342755227 scopus 로고    scopus 로고
    • A technique for interfacial toughness measurement
    • submitted
    • Kuhl and J. Qu, "A Technique for Interfacial Toughness Measurement," J. Electronic Packaging, submitted.
    • J. Electronic Packaging
    • Kuhl1    Qu, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.