Highly corrosion resistant bright silver metallization deposited from a neutral cyanide-free solution

Microelectronic Engineering

Volumn 92, Issue , 2012, Pages 126-129

  Fishelson, N ^a   Inberg, A ^a   Croitoru, N ^a   Shacham Diamand, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Corrosion protection; Electrochemical impedance spectroscopy; SAM characterization; Self assembled monolayers; Silver electrodeposition

Indexed keywords

CORROSION-RESISTANT; CYANIDE ELECTROLYTES; CYANIDE SOLUTION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPIES (EIS); ELECTROCHEMICAL TEST; HIGH QUALITY; OPTICAL AND ELECTRICAL PROPERTIES; PACKAGING LEVELS; PEAK CURRENTS; SAMS; SILVER ELECTRODEPOSITION; SILVER FILM; SILVER METALLIZATION; TRANSFER RESISTANCE;

CORROSION PROTECTION; CORROSION RESISTANCE; CYANIDES; CYCLIC VOLTAMMETRY; ELECTRIC PROPERTIES; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODEPOSITION; METALLIC FILMS; MICROELECTRONICS; PHENOLS; SELF ASSEMBLED MONOLAYERS;

SILVER;

EID: 84858294735     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2011.04.016     Document Type: Conference Paper

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