Application of serial sectioning FIB/SEM tomography in the comprehensive analysis of arrays of metal nanotubes

Journal of Microscopy

Volumn 246, Issue 1, 2012, Pages 33-42

  Phelan, R ^a   Holmes, J D ^a,b   Petkov, N ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

3D FIB SEM tomography; Nanotubes

Indexed keywords

ALUMINA; ALUMINUM OXIDE; DEPOSITION; METAL ANALYSIS; TOMOGRAPHY; YARN;

3D FIB/SEM TOMOGRAPHY; COMPREHENSIVE ANALYSIS; DEPOSITION PROCESS; FIB SEM; NANO SCALE; NANOPOROUS STRUCTURES; NANOTUBULAR MATERIALS; SERIAL SECTIONING; STATE-OF-THE-ART DEVICES; TUBULARS;

NANOTUBES;

ALUMINUM OXIDE; COPPER; NANOTUBE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; FIB SERIAL SECTIONING; IMAGE RECONSTRUCTION; NANOPORE; NONHUMAN; PARTICLE SIZE; POROSITY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING;

EID: 84857998554     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2011.03582.x     Document Type: Article

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