Direct measurements of air layer profiles under impacting droplets using high-speed color interferometry

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 85, Issue 2, 2012, Pages

  Van Der Veen, Roeland C A ^a   Tran, Tuan ^a   Lohse, Detlef ^a   Sun, Chao ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AIR LAYER THICKNESS; AIR LAYERS; COLOR INTERFEROMETRY; DIRECT MEASUREMENT; HIGH-SPEED; IMPACT DYNAMICS; SHORT TIME SCALE; SOLID SURFACE; TIME EVOLUTIONS; WETTING MECHANISM; WETTING PROCESS;

INTERFEROMETRY; LIQUIDS; WETTING;

DROPS;

EID: 84857750410     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.85.026315     Document Type: Article

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