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Volumn 8, Issue 12, 2012, Pages 3322-3328
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A simple approach to characterizing block copolymer assemblies: Graphene oxide supports for high contrast multi-technique imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
3-DIMENSIONAL;
ELECTRON BEAM DAMAGE;
HIGH CONTRAST;
IMAGE CONTRASTS;
MICROSCOPY TECHNIQUE;
NANOSCALE DIMENSIONS;
NO-STAIN;
POLYMERIC ASSEMBLIES;
SAMPLE ANALYSIS;
SAMPLE PREPARATION;
SELF-ASSEMBLE;
SIMPLE APPROACH;
TEM IMAGES;
ATOMIC FORCE MICROSCOPY;
ELECTRON BEAMS;
TRANSMISSION ELECTRON MICROSCOPY;
BLOCK COPOLYMERS;
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EID: 84857732572
PISSN: 1744683X
EISSN: 17446848
Source Type: Journal
DOI: 10.1039/c2sm07040e Document Type: Article |
Times cited : (63)
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References (52)
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