Percolation threshold for electrical resistivity of Ag-nanoparticle/titania composite thin films fabricated using molecular precursor method

Journal of Materials Science

Volumn 47, Issue 8, 2012, Pages 3890-3899

  Likius, Daniel S ^a   Nagai, Hiroki ^a   Aoyama, Sohei ^a   Mochizuki, Chihiro ^a   Hara, Hiroki ^a   Baba, Norio ^a   Sato, Mitsunobu ^a  

^a KOGAKUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOPARTICLE; COMPOSITE THIN FILMS; ELECTRICAL RESISTIVITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; MOLECULAR PRECURSOR METHOD; PERCOLATION THRESHOLDS; PRECURSOR SOLUTIONS; QUARTZ GLASS SUBSTRATES; SEPARATION DISTANCES; TITANIA; TITANIA MATRIX; TITANIUM COMPLEXES; TRANSMISSION ELECTRON; VOLUMETRIC FRACTIONS;

COMPOSITE FILMS; ELECTRIC CONDUCTIVITY; METALLIC MATRIX COMPOSITES; NANOPARTICLES; PERCOLATION (COMPUTER STORAGE); PERCOLATION (FLUIDS); PERCOLATION (SOLID STATE); QUARTZ; SCANNING ELECTRON MICROSCOPY; SIZE SEPARATION; SUBSTRATES; THIN FILMS; TITANIUM COMPOUNDS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

SILVER;

EID: 84857656195     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-011-6245-6     Document Type: Article

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