Monitoring industrial processes with SOM-based dissimilarity maps

Expert Systems with Applications

Volumn 39, Issue 8, 2012, Pages 7110-7120

  Domínguez, Manuel ^a   Fuertes, Juan J ^a   Díaz, Ignacio ^b   Prada, Miguel A ^a   Alonso, Serafín ^a   Morán, Antonio ^a  

^a UNIVERSITY OF LEÓN   (Spain)

^b UNIVERSITY OF OVIEDO   (Spain)

Author keywords

Batch monitoring; Data based monitoring; Industrial processes; Information visualization; Self organizing map

Indexed keywords

APPLICATION FIELDS; BATCH MONITORING; BATCH PROCESS; DYNAMIC INFORMATION; INDUSTRIAL PROCESSS; INFORMATION VISUALIZATION; SELF ORGANIZING; VISUAL COMPARISON; VISUAL EXPLORATION;

BATCH DATA PROCESSING; CHEMICAL DETECTION; CONFORMAL MAPPING; INFORMATION SYSTEMS; NATURAL RESOURCES EXPLORATION; PILOT PLANTS; PROCESS MONITORING;

INDUSTRY;

EID: 84857648380     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2012.01.033     Document Type: Article

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