Detection of periodical patterns in the defects identified by computer vision systems

International Conference on Intelligent Systems Design and Applications, ISDA

Volumn , Issue , 2011, Pages 301-306

  Bulnes, Francisco G ^a   Usamentiaga, Ruben ^a   Garcia, Daniel F ^a   Molleda, Julio ^a  

^a UNIVERSITY OF OVIEDO   (Spain)

Author keywords

Automated Visual Inspection; Clustering Algorithms; Defect Inspection; Periodic Patterns

Indexed keywords

AUTOMATED VISUAL INSPECTION; COMPUTER VISION SYSTEM; CONFIGURATION PARAMETERS; DEFECT INSPECTION; ECONOMIC LOSS; EXPERIMENTAL METHODOLOGY; FALSE DETECTIONS; FLAT PRODUCTS; INSPECTION SYSTEM; MANUFACTURING LINES; OPTIMAL CONFIGURATIONS; OPTIMAL VALUES; PATTERN-MATCHING TECHNIQUE; PERIODIC PATTERN; SINGLE DEFECT; STEEL STRIP;

CLUSTERING ALGORITHMS; IMAGE PROCESSING; INTELLIGENT SYSTEMS; LOSSES; MANUFACTURE; PATTERN MATCHING; SYSTEMS ANALYSIS;

DEFECTS;

EID: 84857620952     PISSN: 21647143     EISSN: 21647151     Source Type: Conference Proceeding    
DOI: 10.1109/ISDA.2011.6121672     Document Type: Conference Paper

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