Real-time ion-flux imaging in the growth of micrometer-scale structures and membranes

Advanced Materials

Volumn 24, Issue 9, 2012, Pages 1238-1242

  Nemeth, Balazs ^a   Symes, Mark D ^a   Boulay, Antoine G ^a   Busche, Christoph ^a   Cooper, Geoffrey J T ^a   Cumming, David R S ^a   Cronin, Leroy ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

ion camera; ionic mapping; ISFET array; monitoring ion flux; polyoxometalates

Indexed keywords

HIGH RESOLUTION; IMAGING DATA; ION FLUXES; IONIC MOVEMENT; MICROMETER-SCALE; POLYOXOMETALATE CLUSTERS; POLYOXOMETALATES; TEMPORAL MAPPINGS;

ION SENSITIVE FIELD EFFECT TRANSISTORS; MICROMETERS; OPTICAL CORRELATION; OPTICAL MICROSCOPY;

IONS;

ION; POLYOXOMETALATE I; TUNGSTEN DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; METHODOLOGY; MICROSCOPY; SEMICONDUCTOR;

IONS; MEMBRANES, ARTIFICIAL; MICROSCOPY; TRANSISTORS, ELECTRONIC; TUNGSTEN COMPOUNDS;

EID: 84857594628     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201104345     Document Type: Article

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