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Volumn 19, Issue 4, 2010, Pages 637-643

Successive large perturbation method for the extraction of more accurate equivalent-circuit-parameters in solar cells

Author keywords

equivalent circuit analysis; Fitting; solar cells

Indexed keywords

CURVE FITTING; DYE-SENSITIZED SOLAR CELLS; ELECTRIC NETWORK PARAMETERS; EXTRACTION; LEAST SQUARES APPROXIMATIONS; NUMERICAL METHODS; ORGANIC SOLAR CELLS; PERTURBATION TECHNIQUES; SILICON SOLAR CELLS; SOLAR CELLS; TIMING CIRCUITS;

EID: 84857542646     PISSN: 02188635     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218863510005558     Document Type: Conference Paper
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.