Electrochemical behavior of potentiodynamically deposited cobalt oxyhydroxide (CoOOH) thin films for supercapacitor application

Materials Research Bulletin

Volumn 47, Issue 3, 2012, Pages 672-676

  Jagadale, A D ^a   Dubal, D P ^a   Lokhande, C D ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

A. Thin film; B. Chemical synthesis; C. Electrochemical measurements

Indexed keywords

B. CHEMICAL SYNTHESIS; ELECTROCHEMICAL BEHAVIORS; ELECTROCHEMICAL MEASUREMENTS; ELECTRODEPOSITION METHODS; FT-IR SPECTRUM; ORTHORHOMBIC CRYSTAL STRUCTURES; OXYHYDROXIDE FILMS; OXYHYDROXIDES; POTENTIODYNAMICS; SCAN RATES; SEM STUDY; SPECIFIC CAPACITANCE; STAINLESS STEEL SUBSTRATES; SUPERCAPACITOR APPLICATION; X-RAY DIFFRACTION STUDIES;

CYCLIC VOLTAMMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

COBALT;

EID: 84857502615     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2011.12.029     Document Type: Article

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