Carbon nanotube interconnects: Process variation via polynomial chaos

IEEE Transactions on Electromagnetic Compatibility

Volumn 54, Issue 1, 2012, Pages 140-148

  Stievano, Igor S ^a   Manfredi, Paolo ^a   Canavero, Flavio G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Carbon nanotubes (CNTs); circuit modeling; circuit simulation; electromagnetic compatibility (EMC); polynomial chaos (PC); stochastic analysis; tolerance analysis; transmission line; uncertainty

Indexed keywords

CIRCUIT MODELING; POLYNOMIAL CHAOS (PC); STOCHASTIC ANALYSIS; TOLERANCE ANALYSIS; TRANSMISSION LINE; UNCERTAINTY;

CIRCUIT SIMULATION; ELECTROMAGNETIC COMPATIBILITY; FITS AND TOLERANCES; MONTE CARLO METHODS; TIME DOMAIN ANALYSIS;

CARBON NANOTUBES;

EID: 84857458946     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2011.2171490     Document Type: Article

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