Manipulating microparticle interactions using highly charged nanoparticles

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 396, Issue , 2012, Pages 51-62

  Ji, Shunxi ^a   Herman, David ^a   Walz, John Y ^a  

^a State University   (United States)

Author keywords

Colloidal forces; Colloidal probe atomic force microscopy; Depletion forces; Nanoparticle adsorption; Nanoparticle halos; Zeta potential measurement

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; POLYSTYRENES; PROBES; SILICA; ZETA POTENTIAL;

CHARGED NANOPARTICLES; COLLOIDAL DISPERSION; COLLOIDAL FORCES; COLLOIDAL PROBES; DEBYE LENGTH; DECAY LENGTH; DEPLETION FORCE; ENERGY WELLS; EXPERIMENTAL STUDIES; EXPONENTIAL BEHAVIORS; LOW CONCENTRATIONS; MICRO PARTICLES; NANOPARTICLE CONCENTRATIONS; NOVEL METHODS; POLYSTYRENE NANOPARTICLES; REPULSIVE SYSTEMS; SILICA SURFACE; SPHERICAL NANOPARTICLES; SURFACE COVERAGES; ZETA POTENTIAL MEASUREMENT;

NANOPARTICLES;

NANOPARTICLE; POLYSTYRENE; SILICON DIOXIDE;

ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; DISPERSION; FORCE; PH; PRIORITY JOURNAL; ZETA POTENTIAL;

EID: 84857358811     PISSN: 09277757     EISSN: 18734359     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2011.12.040     Document Type: Article

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