Efficient analysis of fault trees with voting gates

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 2011, Pages 230-239

  Xiang, Jianwen ^a   Yanoo, Kazuo ^a   Maeno, Yoshiharu ^a   Tadano, Kumiko ^a   Machida, Fumio ^a   Kobayashi, Atsushi ^a   Osaki, Takao ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY DECISION TREES; COMBINATORIAL EXPLOSION; EFFICIENT ANALYSIS; EVALUATION METHOD; FAULT-TOLERANT SYSTEMS; FAULT-TREES; GATE INPUT; K-OUT-OF-N; MINIMAL CUT SETS; ORDERS OF MAGNITUDE; REDUCTION RULES; STANDARD LOGIC;

DECISION TREES;

SOFTWARE RELIABILITY;

EID: 84857082935     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2011.23     Document Type: Conference Paper

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