Real-time ellipsometric characterization of the initial growth stage of poly(3,4-ethylene dioxythiophene): Poly(styrene sulfonic acid) films by electrospray deposition

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 9, 2011, Pages 8030-8034

  Ino, Tomohisa ^a   Asano, Takashi ^a   Fukuda, Takeshi ^a   Ueno, Keiji ^a   Shirai, Hajime ^a  

^a SAITAMA UNIVERSITY   (Japan)

Author keywords

Electrospary deposition; Ellipsometry; PEDOT:PSS; Real time monitoring; Surface reaction

Indexed keywords

DEPOSITION PRECURSORS; ELECTROSPRAY DEPOSITION; GROWING SURFACES; GROWTH STAGES; PEDOT:PSS; POLY(3 ,4-ETHYLENEDIOXYTHIOPHENE); POLY(STYRENE SULFONIC ACID); REAL TIME MONITORING; SPECTRA ANALYSIS;

COALESCENCE; ELLIPSOMETRY; ETHYLENE; MONOLAYERS; NUCLEATION; SPECTROSCOPIC ELLIPSOMETRY; SURFACE REACTIONS; SURFACE ROUGHNESS; SURFACES;

CONDUCTING POLYMERS;

EID: 84856894365     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.5064     Document Type: Conference Paper

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