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Volumn , Issue , 2011, Pages 55-60

Measuring and predicting temperature distributions on FPGAs at run-time

Author keywords

FPGA; ring oscillator; temperature measurement; temperature awareness; thermal model; thread mapping

Indexed keywords

DESIGN TIME; FPGA CONFIGURATION; FREE PARAMETERS; HARDWARE AND SOFTWARE; MAPPING STRATEGY; MULTI-CORES; RE-CONFIGURABLE; REMAPPING; RING-OSCILLATOR; RUNTIMES; SELF-CALIBRATING; TEMPERATURE PREDICTION; TEMPERATURE VARIATION; TEMPERATURE-AWARENESS; THERMAL BEHAVIORS; THERMAL CHARACTERISTICS; THERMAL MODEL;

EID: 84856860925     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ReConFig.2011.59     Document Type: Conference Paper
Times cited : (36)

References (10)
  • 1
    • 33846118079 scopus 로고    scopus 로고
    • Designing reliable systems from unreliable components: The challenges of transistor variability and degradation
    • DOI 10.1109/MM.2005.110
    • S. Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE MICRO, pp. 10-16, Nov./Dec. 2005. (Pubitemid 46567817)
    • (2005) IEEE Micro , vol.25 , Issue.6 , pp. 10-16
    • Borkar, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.