Surface cation segregation and its effect on the oxygen reduction reaction on mixed conducting electrodes investigated by ToF-SIMS and ICP-OES

ECS Transactions

Volumn 35, Issue 3 PART 3, 2011, Pages 1975-1983

  Kubicek, M ^a   Limbeck, A ^a   Fromling T ^a   Hurler, H ^a   Fleig, J ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ETCHING; COMPOSITIONAL ANALYSIS; DEPTH-RESOLVED; ELECTRODE POLARIZATIONS; FILM DEPOSITION TEMPERATURE; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; ICP-OES; IMPEDANCE SPECTROSCOPY; IN-SITU; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY; MIXED-CONDUCTING ELECTRODES; OXYGEN REDUCTION; OXYGEN REDUCTION REACTION; SUB-NM-RESOLUTION; SURFACE CATIONS; THERMAL-ANNEALING; THIN-FILM ELECTRODE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

COBALT COMPOUNDS; ELECTRODES; ELECTROLYTIC REDUCTION; INDUCTIVELY COUPLED PLASMA; OPTICAL EMISSION SPECTROSCOPY; POSITIVE IONS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SOLID OXIDE FUEL CELLS (SOFC);

SURFACE SEGREGATION;

EID: 84856823977     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3570187     Document Type: Conference Paper

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