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Journal of Analytical Atomic Spectrometry

Volumn 27, Issue 2, 2012, Pages 335-339

Promises and pitfalls in the reliable determination of 233U using high resolution ICP-OES

(2) Krachler, Michael a Wegen, Detlef H a

a JOINT RESEARCH CENTRE (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; EMISSION LINES; EMISSION SIGNAL; HIGH RESOLUTION; ICP-OES; ISOTOPIC INFORMATION; MULTIPLE-PEAK; OPTICAL SPECTROMETERS; PEAK WIDTHS; PEAK-DECONVOLUTION; POTENTIAL INTERFERENCES; POTENTIAL SOLUTIONS; WAVELENGTH REGIONS;

MEASUREMENTS; SPECTROMETRY;

ISOTOPES;

EID: 84856707561 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c1ja10288e Document Type: Article

Times cited : (21)

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