Interference compensation for thin layer coulometric ion-selective membrane electrodes by the double pulse technique

Analytical Chemistry

Volumn 84, Issue 3, 2012, Pages 1327-1335

  Grygolowicz Pawlak, Ewa ^a   Numnuam, Apon ^a,b,c   Thavarungkul, Panote ^b,d   Kanatharana, Proespichaya ^b,c   Bakker, Eric ^a  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b Trace Analysis and Biosensor Research Center   (Thailand)

^c Department of Chemistry ^*  (Thailand)

^d PRINCE OF SONGKLA UNIVERSITY   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTES; APPLIED POTENTIALS; BACKGROUND COMPENSATION; COULOMB NUMBER; COULOMETRIC DETECTION; DOUBLE PULSE; DOUBLE PULSE TECHNIQUES; HIGH CONCENTRATION; INTERFERENCE COMPENSATION; INTERFERING IONS; POTENTIOMETRY; RECALIBRATIONS; RELATIVE ERRORS; SELECTIVE MEMBRANES; TETRAETHYLAMMONIUM; THIN LAYERS;

AMMONIUM COMPOUNDS; COULOMETERS; IONS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);

ION SELECTIVE ELECTRODES;

CALCIUM; TETRYLAMMONIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTROCHEMICAL ANALYSIS; INSTRUMENTATION; ION SELECTIVE ELECTRODE; METHODOLOGY; THEORETICAL MODEL;

CALCIUM; ELECTROCHEMICAL TECHNIQUES; ION-SELECTIVE ELECTRODES; MEMBRANES, ARTIFICIAL; MODELS, THEORETICAL; TETRAETHYLAMMONIUM;

EID: 84856693176     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac202273k     Document Type: Article

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