Local refractive index probed via the fluorescence decay of semiconductor quantum dots

Optics Express

Volumn 20, Issue 3, 2012, Pages 3200-3208

  Pillonnet, Anne ^a   Fleury, Pierre ^a   Chizhik, Alexey I ^b   Chizhik, Anna M ^b   Amans, David ^a   Ledoux, Gilles ^a   Kulzer, Florian ^a   Meixner, Alfred J ^b   Dujardin, Christophe ^a  

^a UNIVERSITÉ DE LYON   (France)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

QUANTUM THEORY; REFRACTIVE INDEX;

CDSE/ZNS QUANTUM DOTS; CRITICAL DISTANCE; EFFECTIVE MEDIUM; EMISSION WAVELENGTH; FLUORESCENCE DECAYS; LOCAL INDEX; LUMINESCENCE DECAY TIME; RADIATIVE DECAY;

SEMICONDUCTOR QUANTUM DOTS;

QUANTUM DOT;

ALGORITHM; ARTICLE; LUMINESCENCE; MATERIALS TESTING; METHODOLOGY; REFRACTOMETRY; SEMICONDUCTOR; SPECTROFLUOROMETRY;

ALGORITHMS; LUMINESCENT MEASUREMENTS; MATERIALS TESTING; QUANTUM DOTS; REFRACTOMETRY; SEMICONDUCTORS; SPECTROMETRY, FLUORESCENCE;

EID: 84856496177     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.003200     Document Type: Article

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