Combined SPR and SERS microscopy in the Kretschmann configuration

Journal of Physical Chemistry A

Volumn 116, Issue 3, 2012, Pages 1000-1007

  Meyer, Stefan A ^a   Auguié, Baptiste ^a   Le Ru, Eric C ^a   Etchegoin, Pablo G ^a  

^a VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISPERSIONS; COUPLING CONDITION; FLAT SURFACES; HIGH NUMERICAL APERTURES; KRETSCHMANN CONFIGURATION; METALLIC SURFACE; OFF-AXIS; OIL IMMERSION OBJECTIVE; OPTIMUM COUPLING; PLASMON RESONANCES; RAMAN MICROSCOPE; RAMAN MICROSCOPY; SERS SPECTRUM; SPATIAL RESOLUTION; SPECTROSCOPIC TECHNIQUE; SPOT SIZES; SURFACE PLASMON POLARITONS; SURFACE-ENHANCED RAMAN SCATTERING;

EXCITED STATES; METALLIC COMPOUNDS; PLASMONS; RAMAN SCATTERING; SUBSTRATES;

SURFACE PLASMON RESONANCE;

EID: 84856368234     PISSN: 10895639     EISSN: 15205215     Source Type: Journal    
DOI: 10.1021/jp2107507     Document Type: Article

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