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Acta Materialia

Volumn 60, Issue 4, 2012, Pages 1603-1609

Observation of the critical thickness phenomenon in dislocation dynamics simulation of microbeam bending

(2) Motz, C a Dunstan, D J b

a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE (Austria)

b QUEEN MARY UNIVERSITY OF LONDON (United Kingdom)

Author keywords

Bending test; Critical thickness theory; Dislocation dynamics; Micromechanical modeling; Thin films

Indexed keywords

ALUMINIUM BEAMS; BEAM THICKNESS; CRITICAL THICKNESS; DISCRETE DISLOCATION DYNAMICS; DISLOCATION DENSITIES; DISLOCATION DYNAMICS; DISLOCATION DYNAMICS SIMULATION; FREE SURFACES; MICRO-MECHANICAL MODELING; MICROBEAM BENDING; PLASTIC REGIMES; SURFACE REGION; YIELD POINTS;

BENDING TESTS; CRYSTALLOGRAPHY; PLASTIC DEFORMATION; THIN FILMS;

GEOMETRY;

EID: 84856349172 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/j.actamat.2011.11.060 Document Type: Article

Times cited : (30)

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