Survivability experiment and attack characterization for RFID

IEEE Transactions on Dependable and Secure Computing

Volumn 9, Issue 2, 2012, Pages 289-302

  Zuo, Yanjun ^a  

^a UNIVERSITY OF NORTH DAKOTA   (United States)

Author keywords

and adversary; experiment; quantification; RFID; survivability

Indexed keywords

EXPERIMENTS; RANDOM PROCESSES; STOCHASTIC MODELS; STOCHASTIC SYSTEMS;

AND ADVERSARY; ATTACK STRATEGIES; DIFFERENT EFFECTS; QUANTIFICATION; SIMULATION MODEL; STOCHASTIC PROCESS ALGEBRAS; SURVIVABILITY; SYSTEM SURVIVABILITY;

RADIO FREQUENCY IDENTIFICATION (RFID);

EID: 84856274931     PISSN: 15455971     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDSC.2011.30     Document Type: Article

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