Crosstalk and gate oxide reliability analysis in graphene nanoribbon interconnects

Proceedings - 2011 International Symposium on Electronic System Design, ISED 2011

Volumn , Issue , 2011, Pages 182-187

  Das, Debaprasad ^a   Rahaman, Hafizur ^a  

^a INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

Author keywords

carbon Nanotube (CNT); crosstalk; delay; Graphene nanoribbon (GNR); interconnect; noise; overshoot undershoot

Indexed keywords

DELAY; GRAPHENE NANORIBBON (GNR); INTERCONNECT; NOISE; OVERSHOOT/UNDERSHOOT;

CROSSTALK; ELECTRIC NETWORK ANALYSIS; GATES (TRANSISTOR); GRAPHENE; MOS DEVICES; MULTIWALLED CARBON NANOTUBES (MWCN); SYSTEMS ANALYSIS;

RELIABILITY ANALYSIS;

EID: 84856187060     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISED.2011.54     Document Type: Conference Paper

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