Electrical transport properties in a single-walled carbon nanotube network

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 9, Issue 2, 2012, Pages 183-186

  Snoussi, Karim ^a   Vakhshouri, Amin ^b   Okimoto, Haruya ^c   Takenobu, Taishi ^d   Iwasa, Yoshihiro ^e   Maruyama, Shigeo ^e   Hashimoto, Katsushi ^a,b   Hirayama, Yoshiro ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c YAMAGATA UNIVERSITY   (Japan)

^d WASEDA UNIVERSITY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

Carbon nanotube network; Electrical transport properties; Mott variable range hopping; Quantum interference

Indexed keywords

3D NETWORKS; CARBON NANOTUBE NETWORK; ELECTRICAL TRANSPORT PROPERTIES; ELECTRONIC HOPPING; ELECTRONIC TRANSPORT PROPERTIES; INK-JET METHODS; LOCALISATION; MOTT VARIABLE-RANGE HOPPING; OHMIC BEHAVIOUR; QUANTUM INTERFERENCE; SINGLE-WALLED CARBON NANOTUBE NETWORKS; TEMPERATURE DEPENDENCE;

CARBON; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; MAGNETIC FIELDS; QUANTUM INTERFERENCE DEVICES; SEMICONDUCTING GLASS; TRANSPORT PROPERTIES;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 84856134511     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201100298     Document Type: Article

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