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Volumn 181, Issue 1, 2012, Pages 52-55

Scanning tunneling microscopy evidence for the Mars-van Krevelen type mechanism of low temperature CO oxidation on an FeO(1 1 1) film on Pt(1 1 1)

Author keywords

CO oxidation; Scanning tunneling microscopy; Thin oxide films

Indexed keywords

CO OXIDATION; EXPERIMENTAL EVIDENCE; LOW-TEMPERATURE CO OXIDATION; MARS-VAN KREVELEN; OXYGEN ATOM; PT(111); THIN OXIDE FILMS; TRILAYERS; ULTRA-THIN;

EID: 84856101686     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cattod.2011.08.033     Document Type: Article
Times cited : (48)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.