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Solid State Sciences

Volumn 14, Issue 2, 2012, Pages 225-228

Colossal dielectric constant in PrFeO 3 semiconductor ceramics

(4) Prasad, Bandi Vittal a Rao, G Narsinga b Chen, J W b Babu, D Suresh a

a OSMANIA UNIVERSITY (India)

b NATIONAL TAIWAN UNIVERSITY (Taiwan)

Author keywords

Ceramics; Dielectric properties; Electronic Characterization; Sintering

Indexed keywords

CERAMICS; COLOSSAL DIELECTRIC CONSTANT; EFFECTIVE DIELECTRIC CONSTANTS; EFFECTIVE PERMITTIVITY; ELECTRONIC CHARACTERIZATION; FREQUENCY RANGES; GRAIN BOUNDARY EFFECTS; IMPEDANCE SPECTROSCOPY; PRIMARY SOURCES; ROOM TEMPERATURE; SEMICONDUCTING GRAINS; TEMPERATURE RANGE;

CERAMIC MATERIALS; DIELECTRIC PROPERTIES; GRAIN BOUNDARIES; PERMITTIVITY; PEROVSKITE; SEMICONDUCTOR INSULATOR BOUNDARIES; SINTERING; SOL-GEL PROCESS;

DIELECTRIC MATERIALS;

EID: 84856003012 PISSN: 12932558 EISSN: None Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2011.11.016 Document Type: Article

Times cited : (53)

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