Quantification of passivation layer growth in inert anodes for molten salt electrochemistry by in situ energy-dispersive diffraction

Journal of Applied Crystallography

Volumn 45, Issue 1, 2012, Pages 28-37

  Rowles, Matthew R ^a,b   Styles, Mark J ^a,b   Madsen, Ian C ^a   Scarlett, Nicola V Y ^a   McGregor, Katherine ^a   Riley, Daniel P ^c   Snook, Graeme A ^a   Urban, Andrew J ^a   Connolley, Thomas ^d   Reinhard, Christina ^d  

^a CSIRO   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^d DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

electrolysis; in situ energy dispersive diffraction; Rietveld refinement

Indexed keywords

ELECTROLYSIS TIME; ELECTROWINNING CELLS; ENERGY-DISPERSIVE DIFFRACTION; ENERGY-DISPERSIVE X-RAY DIFFRACTION; IN-SITU; INERT ANODE; LAYER FORMATION; LAYER THICKNESS; LIMITING STEP; MOLTEN SALT; PASSIVATION LAYER; QUANTITATIVE PHASE ANALYSIS; RATE OF INCREASE; RIETVELD; RUTILE FORMATION; SOLID-STATE DIFFUSION; TIO;

ANODES; CRYSTAL STRUCTURE; DIFFUSION IN SOLIDS; ELECTROLYSIS; FUSED SALTS; OXIDE MINERALS; PASSIVATION; TITANIUM; TITANIUM DIOXIDE; X RAY DIFFRACTION;

RIETVELD REFINEMENT;

EID: 84855978019     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811044104     Document Type: Article

References (39)

1. Andersson, S., Collen, B., Kuylenstierna, U. & Magnéli, A. (1957). Acta Chem. Scand. 11, 1641-1652.
2. Azároff, L. V. (1955). Acta Cryst. 8, 701-704.
3. Barnes, P., Colston, S., Craster, B., Hall, C., Jupe, A., Jacques, S., Cockcroft, J.,Morgan, S., Johnson, M., O'Connor, D. & Bellotto,M. (2000). J. Synchrotron Rad. 7, 167-177.
4. Bruker (2009). TOPAS. Version 4.2. Bruker AXS, Karlsruhe, Germany.
5. Cernik, R. J., Hansson, C. C. T., Martin, C. M., Preuss, M., Attallah, M., Korsunsky, A. M., Belnoue, J. P., Jun, T. S., Barnes, P., Jacques, S., Sochi, T. & Lazzari, O. (2011). J. Appl. Cryst. 44, 150-157.
6. Fray, D. J. (2008). Int. Mater. Rev. 53, 317-325.
7. Gerward, L., Mørup, S. & Topsøe, H. (1976). J. Appl. Phys. 47, 822-825.
8. Gianatta, M. V. (2000). JOM, 52, 18-20.
9. Giessen, B. C. & Gordon, G. E. (1968). Science, 159, 973-975.
10. Habashi, F. (1997). Handbook of Extractive Metallurgy. Weinheim: Wiley-VCH.
11. Häusermann, D. & Barnes, P. (1992). Phase Transitions, 39, 99-115.
12. Hayfield, P. C. S. (1983). US Patent 4 422 917.
13. Hill, R. J. & Howard, C. J. (1987). J. Appl. Cryst. 20, 467-474.
14. Hubbell, J. H. & Seltzer, S. M. (2004). Tables of X-ray Mass Attenuation Coefficients and Mass Energy-Absorption Coefficients from 1 keV to 20 MeV for Elements Z = 1 to 92 and 48 Additional Substances of Dosimetric Interest, NIST Standard Reference Database 126, http://www.nist.gov/pml/data/ xraycoef/index.cfm.
15. Jiao, S. & Fray, D. J. (2010). Metall. Mater. Trans. B, 41, 74-79.
16. Kortright, J. B. & Thompson, A. C. (2001). X-ray Emission Energies, X-ray Data Booklet, edited by A. C. Thompson & D. Vaughan. Berkeley: Lawrence Berkeley National Laboratory.
17. Kraft, E. H. (2004). Summary of Emerging Titanium Cost Reduction Technologies. EHK Technologies.
18. Kroll, W. (1940). Trans. Am. Electrochem. Soc. 78, 35-47.
19. Lange, J. (1995). Acta Cryst. A51, 559-565.
20. Le Page, Y. & Strobel, P. (1982a). J. Solid State Chem. 43, 314-319.
21. Le Page, Y. & Strobel, P. (1982b). J. Solid State Chem. 44, 273-281.
22. Madsen, I. C., Scarlett, N. V. Y., Cranswick, L. M. D. & Lwin, T. (2001). J. Appl. Cryst. 34, 409-426.
23. McGregor, K., Frazer, E. J., Urban, A. J., Pownceby, M. I. & Deutscher, R. L. (2006). ECS Trans. 2, 369-380.
24. McGregor, K., Urban, A. J. & Frazer, E. J. (2007). Proceedings of the 11th World Conference on Titanium, edited by M. Niinomi, S. Akiyama, M. Hagiwara, M. Ikeda & K. Maruyama, pp. 127-130. Sendai: The Japan Institute of Metals.
25. Pawlek, R. P. (2008). Inert Anodes: An Update, Light Metals 2008, pp. 1039-1045.Warrendale: Minerals, Metals and Materials Society.
26. Pawlek, R. P. (2010). Wettable Cathodes: An Update, Light Metals 2010, pp. 377-382. Warrendale: Minerals, Metals and Materials Society.
27. Restori, R., Schwarzenbach, D. & Schneider, J. R. (1987). Acta Cryst. B43, 251-257.
28. Rietveld, H. M. (1969). J. Appl. Cryst. 2, 65-71.
29. Rowles, M. R. (2011). J. Synchrotron Rad. 18, 938-941.
30. Rowles, M. R., Scarlett, N. V. Y., Madsen, I. C. & McGregor, K. (2011). J. Appl. Cryst. 44, 853-857.
31. Russenbeek, J., Gao, Y., Zhong, Z., Croft, M., Jisrawi, N., Ignatov, A. & Tsakalakos, T. (2011). J. Power Sources, 196, 2332-2339.
32. Sánchez Del Ŕo, M. & Dejus, R. J. (1997). Proc. SPIE, 3152, 148-157.
33. Scarlett, N. V. Y., Madsen, I. C., Cranswick, L. M. D., Lwin, T., Groleau, E., Stephenson, G., Aylmore, M. & Agron-Olshina, N. (2002). J. Appl. Cryst. 35, 383-400.
34. Scarlett, N. V. Y., Madsen, I. C., Evans, J. S. O., Coelho, A. A., McGregor, K., Rowles, M., Lanyon, M. R. & Urban, A. J. (2009). J. Appl. Cryst. 42, 502-512.
35. Snook, G. A., McGregor, K., Urban, A. J. & Lanyon, M. R. (2009). J. Solid State Electrochem. 13, 591-598.
36. Stinton, G. W. & Evans, J. S. O. (2007). J. Appl. Cryst. 40, 87-95.
37. Styles,M. J., Rowles,M. R., Madsen, I. C.,McGregor, K., Urban, A. J., Snook, G. A., Scarlett, N. V. Y. & Riley, D. P. (2012). J. Synchrotron Rad. 19, 39-47.
38. Tzeng, H. S., Ishi, K. & Kamiya, M. (1976). Chin. J. Phys. 13, 47-49.
39. Young, R. A. (1993). The Rietveld Method, edited by R. A. Young, pp. 1-38. New York: Oxford University Press Inc.