Reverse Monte Carlo refinements of nanoscale atomic correlations using powder and single-crystal diffraction data

Journal of Applied Crystallography

Volumn 45, Issue 1, 2012, Pages 106-112

  Krayzman, Victor ^a,b   Levin, Igor ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

nanoscale atomic correlations; reverse Monte Carlo; RMCProfile

Indexed keywords

ATOMIC CORRELATION; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; LOCAL ATOMIC STRUCTURES; NANO SCALE; NANOSCALE RANGES; REALISTIC MODEL; REVERSE MONTE CARLO; REVERSE MONTE CARLO METHOD; REVERSE MONTE CARLO REFINEMENTS; RMCPROFILE; SIMULATED DATA; SIMULTANEOUS FITTING; SINGLE-CRYSTAL DIFFRACTION; STRUCTURED DIFFUSE SCATTERING; TOTAL SCATTERING;

ATOMS; COMPUTER SIMULATION; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; INTERFEROMETRY; MONTE CARLO METHODS; NANOTECHNOLOGY; NEUTRONS; NIOBIUM; PEROVSKITE; SCATTERING;

CRYSTAL ATOMIC STRUCTURE;

EID: 84855957221     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812000398     Document Type: Article

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