|
Volumn 99, Issue 26, 2011, Pages
|
Evolution of sheet resistance of thin Ni film deposited on porous anodic alumina substrate
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON TRANSPORT;
ELECTRON TRANSPORT MEASUREMENTS;
FILM CONDUCTANCES;
IN-SITU;
NI FILMS;
NICKEL FILM;
PERCOLATION MODELS;
PORE ARRAYS;
POROUS ALUMINA SUBSTRATES;
POROUS ANODIC ALUMINA;
POROUS FILM;
SURFACE AREA;
SURFACE GEOMETRIES;
UNIFORM FILMS;
ALUMINA;
ELECTRON TRANSITIONS;
ELECTRON TRANSPORT PROPERTIES;
METAL INSULATOR BOUNDARIES;
METAL INSULATOR TRANSITION;
PERCOLATION (SOLID STATE);
SEMICONDUCTOR INSULATOR BOUNDARIES;
SHEET METAL;
SHEET RESISTANCE;
SOLVENTS;
SUBSTRATES;
TWO DIMENSIONAL;
FILM GROWTH;
|
EID: 84855685234
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3672211 Document Type: Article |
Times cited : (5)
|
References (16)
|