Bayesian model averaging for reliability analysis with probability distribution model form uncertainty

Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference

Volumn , Issue , 2009, Pages

  McFarland, John M ^a   Bichon, Barron J ^a  

^a SOUTHWEST RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVIATION; BAYESIAN NETWORKS; DESIGN AIDS; RELIABILITY ANALYSIS; STRUCTURAL DYNAMICS; UNCERTAINTY ANALYSIS;

BAYESIAN MODEL AVERAGING; DISTRIBUTION MODEL PARAMETERS; DISTRIBUTION MODELS; GLOBAL RELIABILITY; INPUT RANDOM VARIABLES; MEMSDEVICES; OBSERVED DATA; PROBABILITY DISTRIBUTION MODEL;

PROBABILITY DISTRIBUTIONS;

EID: 84855636577     PISSN: 02734508     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2009-2231     Document Type: Conference Paper

References (15)

1. Bichon, B. J., McFarland, J. M., and Mahadevan, S., "Using Bayesian Inference and Efficient Global Reliability Analysis to Explore Distribution Uncertainty," Proceedings of the 49th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Schaumburg, IL, April 7-10 2008.
2. Marhadi, K., Venkataraman, S., and Pai, S., "Quantifying Uncertainty in Statistical Distribution of Small Sample Data Using Bayesian Inference of Unbounded Johnson Distribution," Proceedings of the 49th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Schaumburg, IL, April 7-10 2008.
3. Sirimamilla, R., Venkataraman, S., and Pai, S., "Incorporating Data Uncertainty in Reliability Based Design Optimization Using Inverse Reliability Measures," Proceedings of the 49th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Schaumburg, IL, April 7-10 2008.
4. Venkatararaman, S., Sirimamilla, R. R., Mahadevan, S., Nagpal, V., Strack, B., and Pai, S. S., "Calculating Confidence Bounds for Reliability Index to Quantify Effect of Distribution Parameter Uncertainty," Proceedings of the 48th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Waikiki, HI, April 23-26 2007.
5. Wasserman, L., "Bayesian Model Selection and Model Averaging," Journal of Mathematical Psychology, Vol. 44, No. 1, 2000.
6. McFarland, J., Uncertainty Analysis for Computer Simulations through Validation and Calibration, Ph.D. thesis, Van-derbilt University, 2008.
7. Kass, R. E. and Wasserman, L., "A reference Bayesian test for nested hypotheses and its relationship to the Schwarz criterion," Journal of the American Statistical Assocaition, Vol. 90, 1995, pp. 928-934.
8. Haldar, A. and Mahadevan, S., Probability, Reliability, and Statistical Methods in Engineering Design, John Wiley and Sons, Inc., New York, 2000.
9. Bichon, B. J., Eldred, M. S., Swiler, L. P., Mahadevan, S., and McFarland, J. M., "Efficient global reliability analysis for nonlinear implicit performance functions," AIAA Journal, Vol. 46, No. 10, 2008, pp. 2459-2468.
10. Adams, B. M., Eldred, M. S., Wittwer, J., and Massad, J., "Reliability-Based Design Optimization for Shape Design of Compliant Micro-Electro-Mechanical Systems," Proceedings of the 11th AIAA/ISSMO Multidisciplinary Analysis and Optimization Conference, Portsmouth, VA, Sept. 6-8 2006.
11. Adams, B. M., Bichon, B. J., Carnes, B., Copps, K. D., Eldred, M. S., Hopkins, M. H., Neckels, D. C., Notz, P. K., Subia, S. R., and Wittwer, J. W., "Solution-Verified Reliability Analysis and Design of Bistable MEMS using Error Estimation and Adaptivity," Tech. Rep. SAND2006-6286, Sandia National Laboratories, Oct. 2006.
12. Ananthasuresh, G. K., Kota, S., and Gianchandani, Y., "A Methodical Approach to the Design of Compliant Micromech-anisms," Proc. IEEE Solid-State Sensor and Actuator Workshop, Hilton Head Island, SC, 1994, pp. 189-192.
13. Jensen, B. D., Parkinson, M. B., Kurabayashi, K., Howell, L. L., and Baker, M. S., "Design Optimization of a Fully-Compliant Bistable Micromechanism," Proc. 2001 ASME Intl. Mech. Eng. Congress and Exposition, New York, NY, November 11-16 2001.
14. Kemeny, D. C., Howell, L. L., and Magleby, S. P., "Using Compliant Mechansims to Improve Manufacturability in MEMS," Proc. 2002 ASME DETC, No. DETC2002/DFM-34178, 2002.
15. Silverman, B. W., Density Estimation for Statistics and Data Analysis, Chapman & Hall/CRC, New York, 1986.