SCOPUS 정보 검색 플랫폼

Volumn 105, Issue 2, 2011, Pages 427-434

Detection of acetylene impurities in ethylene and polyethylene manufacturing processes using tunable diode laser spectroscopy in the 3-μm range

(11) Kluczynski, P a Jahjah, M b Nahle L c Axner, O d Belahsene, S b Fischer, M c Koeth, J c Rouillard, Y b Westberg, J d Vicet, A b Lundqvist, S a

a Box 14153 (Sweden)

b UNIVERSITÉ MONTPELLIER II (France)

c NANOPLUS NANOSYSTEMS AND TECHNOLOGIES GMBH (Germany)

d UMEÅ UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND SPECTRA; DETECTION LIMITS; GAINASSB; HYDROCARBON COMPOUNDS; HYDROGENATION REACTORS; IMPURITIES IN; LABORATORY CONDITIONS; MANUFACTURING PROCESS; PROCESS STREAMS; PURE POLYMERS; TEMPERATURE CYCLING; TEMPERATURE DRIFTS; TUNABLE DIODE LASER SPECTROSCOPY; WAVELENGTH REGIONS;

ACETYLENE; DISTRIBUTED FEEDBACK LASERS; ETHANE; ETHYLENE; LIGHTING; MANUFACTURE; ORGANIC COMPOUNDS; SEMICONDUCTOR LASERS;

LASER SPECTROSCOPY;

EID: 84855570825 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s00340-011-4645-6 Document Type: Article

Times cited : (69)

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