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Volumn 115-116, Issue , 2012, Pages 31-37

Semiconductor oxides-sensitized photodegradation of fenamiphos in leaching water under natural sunlight

Author keywords

Fenamiphos; Fenamiphos sulfone; Fenamiphos sulfoxide; Photocatalytic oxidation; Semiconductor materials; Water detoxification

Indexed keywords

DEGRADATION RATE; FENAMIPHOS; FENAMIPHOS SULFOXIDE; LEACHING WATERS; NATURAL SUNLIGHT; PHOTO CATALYTIC DEGRADATION; PHOTO-CATALYTIC; PHOTOCATALYTIC OXIDATIONS; PILOT PLANT SCALE; PSEUDO-FIRST ORDER KINETICS; TIO; ZNO;

EID: 84855504335     PISSN: 09263373     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apcatb.2011.12.023     Document Type: Article
Times cited : (48)

References (19)
  • 3
    • 84857688028 scopus 로고    scopus 로고
    • Fenamiphos environmental risk assessment, US Environmental Protection Agency, Provided for SRRD by EFED's Fenamiphos RED Team, Available from: .
    • G. Patrick, A. Chiri, D. Randall, E.L. Libelo, R.D. Jones, Fenamiphos environmental risk assessment, US Environmental Protection Agency, Provided for SRRD by EFED's Fenamiphos RED Team, 2001, Available from: http://www.epa.gov/oppsrrd1/REDs/fenamiphos_ired.pdf.
    • (2001)
    • Patrick, G.1    Chiri, A.2    Randall, D.3    Libelo, E.L.4    Jones, R.D.5
  • 12
    • 84857688029 scopus 로고    scopus 로고
    • OECD, Organisation for Economic Cooperation and Development Guidelines for Testing of Chemicals, N(312, Leaching in Soil Columns, Paris.
    • OECD, Organisation for Economic Cooperation and Development Guidelines for Testing of Chemicals, N(312, Leaching in Soil Columns, Paris, 2007.
    • (2007)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.