The optical effects of capping layers on the performance of transparent organic light-emitting diodes

IEEE Photonics Journal

Volumn 4, Issue 1, 2012, Pages 39-47

  Huh, Jin Woo ^a   Moon, Jaehyun ^a   Lee, Joo Won ^a   Cho, Doo Hee ^a   Shin, Jin Wook ^a   Han, Jun Han ^a   Hwang, Joohyun ^a   Joo, Chul Woong ^a   Lee, Jeong Ik ^a   Chu, Hye Yong ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

bottom to top ratio; capping layer; high efficiency; refractive index; spectra matching; Transparent organic light emitting diodes

Indexed keywords

BOTTOM TO TOP RATIO; CAPPING LAYER; OPTICAL EFFECTS; OPTICAL PATH; SPECTRAL DISTRIBUTION; SPECTRAL MATCHINGS; TOP EMISSION; TOP-EMITTING; TOTAL EMISSIONS; TRANSPARENT ORGANIC LIGHT-EMITTING DIODES;

DIODES; ORGANIC LIGHT EMITTING DIODES (OLED);

LIGHT EMISSION;

EID: 84855462895     PISSN: 19430655     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOT.2011.2176478     Document Type: Article

References (19)

1. V. Bulvoic, G. Gu, P. E. Burrow, M. E. Thomson, and S. R. Forrest, "Transparent light-emitting devices," Nature, vol. 380, no. 6569, p. 29, Mar. 1996.
2. L. S. Hung, C. W. Tang, M. G. Mason, P. Raychaudhuri, and J. Madathil, "Application of an ultrathin LiF/Al bilayer in organic surface-emitting diodes," Appl. Phys. Lett., vol. 78, no. 4, pp. 544-546, Jan. 2001. (Pubitemid 33629960)
3. S. K. So, W. K. Choi, L. M. Leung, and K. Neyts, "Interference effects in bilayer organic light-emitting diodes," Appl. Phys. Lett., vol. 74, no. 14, pp. 1939-1941, Apr. 1999. (Pubitemid 129310500)
4. Q. Huang, K. Walzer, M. Pfeiffer, V. Lyssenko, G. He, and K. Leo, "Highly efficient top emitting organic light-emitting diodes with organic outcoupling enhancement layers," Appl. Phys. Lett., vol. 88, no. 11, pp. 113515-1-113515-3, Mar. 1999.
5. Y. Fukuda, T. Watanabe, T. Wakimoto, S. Miyaguchi, and M. Tsuchida, "Carrier transport properties of organic materials for EL device operation," Synth. Met., vol. 111/112, pp. 331-333, Jun. 2000.
6. T. A. Beierlein, H.-P. Ott, H. Hofmann, H. Riel, B. Ruhstaller, B. Crone, S. Karg, and W. Rieß, "Combinatorial device fabrication and optimization of multilayer organic LEDs," in Proc. SPIE, 2002, vol. 4464, pp. 178-186. (Pubitemid 35152544)
7. H. Riel, S. Karg, T. Beierlein, W. Rieß;, and K. Neyts, "Tuning the emission characteristics of top-emitting organic light-emitting devices by means of a dielectric capping layer: An experimental and theoretical study," J. Appl. Phys., vol. 94, no. 8, pp. 5290-5296, Oct. 2003.
8. J. Huang, M. Pfeiffer, A. Werner, J. Blochwitz, S. Liu, and K. Leo, "Low-voltage organic electroluminescent devices using pin structures," Appl. Phys. Lett., vol. 80, no. 1, pp. 139-141, Jan. 2002.
9. B. J. Chen, X. W. Sun, and S. C. Tan, "Transparent organic light-emitting devices with LiF/Mg:Ag cathode," Opt. Exp., vol. 13, no. 3, pp. 937-941, Feb. 2005. (Pubitemid 40334894)
10. 3 layer," Opt. Exp., vol. 19, no. 2, pp. 1113-1121, Jan. 2011.
11. J. Lee, J.-I. Lee, J.-W. Lee, and H. Y. Chu, "Interlayer engineering with different host material properties in blue phosphorescent organic light-emitting diodes," ETRI J., vol. 33, no. 1, pp. 32-38, Feb. 2011.
12. Sim4tec GmbH. [Online]. Available: www.sim4tec.com
13. J. Staudigel, M. Stoessel, F. Steuber, and J. Simmere, "A quantitative numerical model of multilayer vapor-deposited organic light emitting diodes," J. Appl. Phys., vol. 86, no. 7, pp. 3895-3910, Oct. 1999. (Pubitemid 129304690)
14. R. Meerheim, R. Nitsche, and K. Leo, "High-efficiency monochrome organic light emitting diodes employing enhanced microcavities," Appl. Phys. Lett., vol. 93, no. 4, pp. 043310-1-043310-3, Jul. 2008.
15. H. Riel, S. Karg, T. Beierlein, B. Ruhstaller, and W. Rieß, "Phosphorescent top-emitting organic light-emitting devices with improved light outcoupling," Appl. Phys. Lett., vol. 82, no. 3, pp. 466-468, Jan. 2003.
16. O. S. Heavens, "Optical properties of thin films," Rep. Progr. Phys., vol. 23, pp. 1-65, 1960.
17. F. A. Jenkins and H. E. White, Fundamentals of Optics, 4th., New York: McGraw-Hill, 1986.
18. N. D. Goldina, "Calculation of the reflection coefficient of metal-dielectric structures in frustrated total internal reflection," Optoelectron. Instrum. Data Process., vol. 45, no. 6, pp. 571-575, Dec. 2009.
19. J. M. Bennett, "Precise method for measuring the absolute phase change on reflection," J. Opt. Soc. Amer., vol. 54, no. 5, pp. 612-624, May 1964.