Wideband characterization of backscatter channels

17th European Wireless Conference 2011, EW 2011

Volumn , Issue , 2011, Pages 205-211

  Arnitz, Daniel ^a   Muehlmann, Ulrich ^b   Witrisal, Klaus ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FADING (RADIO); RADIO FREQUENCY IDENTIFICATION (RFID); RADIO SYSTEMS;

CHANNEL PARAMETER; FADING STATISTICS; NARROW BANDS; UHF RFID; ULTRA-HIGH FREQUENCY; WIDE-BAND; WIRELESS CHANNEL;

BACKSCATTERING;

EID: 84855459422     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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