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Volumn 47, Issue 21, 2011, Pages 1178-1180
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No-reference sharpness metric based on inherent sharpness
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGHLY-CORRELATED;
NO REFERENCES;
WAVELET COEFFICIENTS;
ELECTRONICS ENGINEERING;
TECHNOLOGY;
IMAGE QUALITY;
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EID: 84855376460
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el.2011.2222 Document Type: Article |
Times cited : (12)
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References (7)
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