Note: Integration of trapped ion mobility spectrometry with mass spectrometry

Review of Scientific Instruments

Volumn 82, Issue 12, 2011, Pages

  Fernandez Lima, F A ^a   Kaplan, D A ^b   Park, M A ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b BRUKER DALTONIK GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BATH GAS; GASPHASE; ION CONFINEMENTS; ION TRANSMISSION; MASS ANALYSIS; OPTICAL CONDITION; RAPID ANALYSIS; SOURCE CONDITIONS; TRAPPED ION;

ION SOURCES; MASS SPECTROMETRY; SEPARATION; THERMAL INSULATING MATERIALS;

MASS SPECTROMETERS;

ARTICLE; ELECTROSPRAY MASS SPECTROMETRY; INSTRUMENTATION; MASS SPECTROMETRY; METHODOLOGY; SYSTEM ANALYSIS; TIME;

MASS SPECTROMETRY; SPECTROMETRY, MASS, ELECTROSPRAY IONIZATION; SYSTEMS INTEGRATION; TIME FACTORS;

EID: 84855332805     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665933     Document Type: Article

References (2)

1. F. A. Fernandez-Lima, D. A. Kaplan, J. Suetering, and M. A. Park, Int. J. Ion Mobility Spectrosc. 14, 93 (2011), and references herein 10.1007/s12127-011-0067-8
2. L. A. Flanagan, U. S. patent 5872357, Hewlett-Packard Company, Palo Alto, CA, USA, February 16, 1999, p. 19.