Novel accelerated testing method for III-V concentrator solar cells

Microelectronics Reliability

Volumn 50, Issue 9-11, 2010, Pages 1880-1883

  Nunez N ^a,b   Vazquez M ^a,b   Gonzalez J R ^a   Algora, C ^a   Espinet, P ^a  

^a INSTITUTO DE ENERGÍA SOLAR   (Spain)

^b UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); SOLAR POWER GENERATION;

ACCELERATED TESTING; ACCELERATED TESTING METHOD; CLIMATIC CHAMBER; CONCENTRATION PHOTOVOLTAIC; CONCENTRATOR SOLAR CELLS; EQUIVALENT CURRENTS; HIGH TEMPERATURE; POWER DEGRADATION;

SOLAR CELLS;

EID: 84755161468     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.07.085     Document Type: Conference Paper

References (14)

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